|
Spring
Contact Probe
|
|
|
| |
N38 |
0.55 (0.022) |
| |
N50 |
0.80 (0.031) |
| |
N70 |
1.27 (0.050) |
| |
N75 |
1.27 (0.050) |
| |
N102 |
1.90 (0.075) |
| |
N103 |
1.90 (0.075) |
| |
N133 |
2.54 (0.100) |
| |
N134 |
2.54 (0.100) |
|
|
In-circuit
test probe
|
| |
N90 |
1.90 (0.075) |
| |
N105 |
1.90 (0.075) |
| |
N136 |
2.54 (0.100) |
| |
N135 |
2.54 (0.100) |
| |
N1350 |
2.54 (0.100) |
| |
N200 |
3.18 (0.125) |
| |
N240 |
3.96 (0.156) |
| |
N260 |
4.75 (0.187) |
| |
NS130 |
|
| |
N350 |
4.75 (0.187) |
| |
N160 |
|
|
|
IC
test probe
|
| |
ND845G-051 |
|
| |
ND570G-051 |
|
| |
ND900G-140 |
|
| |
ND215G-190 |
|
| |
ND118-410 |
|
|
 |
|
|
|
＝
|
Application |
|
- Bare board test |
|
- In-circuit board
test |
|
- Wafer impedance
test with probe card |
|
(u-BGA,
TSOP, SOJ, QFP) |
|
- Crystal oscillation
radiator test |
|
- LCD board test |
|
- Burn-in test |
| |
|
|
|
|
|
